Storage & Controller Performance Testing
The Disk I/O Stress module is designed to push your storage subsystem to its limits. It repeatedly creates, writes large alternating data patterns to, and then immediately deletes files to generate sustained, high-intensity disk input/output operations. This process stresses the disk drive, storage controller, and data buses.
This operation involves writing large files (2GB per cycle) using four distinct byte patterns (0xAA, 0x55, 0xFF, 0x00). This alternating data stream is designed to stress the disk's internal cache and wear-leveling algorithms, preventing predictable compression or optimization.
To maximize I/O stress and metadata operations, the module continuously creates new files, performs the large data writes, and then immediately deletes them. This cycle is repeated multiple times (8 cycles for 16GB total I/O), ensuring constant interaction with the file system and underlying storage hardware.
Sustained large writes and metadata operations stress the physical platters/NAND, read/write heads, and internal controllers of the storage device.
High data throughput and constant command queues push the limits of SATA/NVMe controllers and the PCIe bus.
The rapid creation and deletion of files, coupled with alternating data patterns, challenges the operating system's file system and I/O caching mechanisms.
Intensive I/O operations can increase the temperature of storage devices and surrounding components, testing system cooling.
This module will generate extremely high disk I/O. Extended execution, especially on SSDs, may contribute to drive wear (reduced lifespan) due to intensive write cycles. Ensure adequate system cooling and backup critical data before running intensive tests.